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Takaki, Seiya*; Yasuda, Kazuhiro*; Yamamoto, Tomokazu*; Matsumura, Sho*; Ishikawa, Norito
Nuclear Instruments and Methods in Physics Research B, 326, p.140 - 144, 2014/05
Times Cited Count：39 Percentile：94.68(Instruments & Instrumentation)We have investigated atomic structure of ion tracks in CeO
irradiated with 200 MeV Xe ions by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). TEM observations under inclined conditions showed continuous ion tracks with diffraction and structure factor contrast, and the decrease in the atomic density of the ion tracks was evaluated. High resolution STEM with high-angle annular dark-field (HAADF) technique showed that the crystal structure of the Ce cation column is retained at the core region of ion tracks, although the signal intensity of the Ce cation lattice is reduced over a region nm in size. Annular bright field (ABF) STEM observation has detected that the O anion column is preferentially distorted at the core region of ion tracks within a diameter of 4 nm.
Yamaki, Tetsuya; Kato, Sho; Yamamoto, Shunya; Hakoda, Teruyuki; Kawaguchi, Kazuhiro*; Kobayashi, Tomohiro*; Suzuki, Akihiro*; Terai, Takayuki*
no journal, ,
Chemical transformations involved during ion implantation can lead to material modifications. Our focus here was on the interaction of tungsten (W) ions implanted in glassy carbon (GC). Recent studies dealt with nanosized particles of W carbides in a W-ion-implanted GC substrate in terms of their composition, electrochemical properties, and morphology. In this paper, we discuss a detailed study of compound formation resulting from W implants in GC for the first time, emphasizing the importance of chemical interactions in determining the final properties of the implanted layer.
